Paper
24 January 2011 Growth and characterization of low density droplet GaAs quantum dots for single photon sources
S.-K. Ha, J. D. Song, J. Y. Lim, S. Bounouar, F. Donatini, L. S. Dang, J. P. Poizat, J. S. Kim, W. J. Choi, I. K. Han, J. I. Lee
Author Affiliations +
Abstract
We have grown GaAs quantum dots (QDs) in Al0.3Ga0.7As matrix by droplet epitaxy for application in single photon sources. This growth method enables the formation of QDs without strain, with emission wavelengths of around 700 nm within the optimal detection range of cost effective silicon detector, and with reduced surface density of several tens to a few QDs per μm2 for easier isolation of single QDs. The optical properties of QDs were envisaged by exciton and biexciton emission peaks identified from power dependent and time-resolved micro-photoluminescence (μ-PL) measurements. The possibility of fabricating photonic crystal (PC) resonator including a single QD was shown by obtaining precise spectral and spatial information from a few QDs in a mesa structure, utilizing cathodoluminescence (CL) measurements.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S.-K. Ha, J. D. Song, J. Y. Lim, S. Bounouar, F. Donatini, L. S. Dang, J. P. Poizat, J. S. Kim, W. J. Choi, I. K. Han, and J. I. Lee "Growth and characterization of low density droplet GaAs quantum dots for single photon sources", Proc. SPIE 7945, Quantum Sensing and Nanophotonic Devices VIII, 79452H (24 January 2011); https://doi.org/10.1117/12.871432
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Cited by 2 scholarly publications.
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KEYWORDS
Gallium arsenide

Single photon

Sensors

Quantum dots

Excitons

Silicon

Scanning electron microscopy

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