Design of high-speed electrical capacitance tomography system

Yanli Gao; Yonggao Zhang; Weidong Wang

doi:10.1117/12.968547

8 June 2012 Design of high-speed electrical capacitance tomography system

Yanli Gao, Yonggao Zhang, Weidong Wang

Proceedings Volume 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012); 83343X (2012) https://doi.org/10.1117/12.968547
Event: Fourth International Conference on Digital Image Processing (ICDIP 2012), 2012, Kuala Lumpur, Malaysia

Abstract

It is important to improve quality and rate of reconstruction image, which also is a hot spot for ECT researchers, in order to realize measurement on-line for multi-phase flow parameters of high-speed industry processes by using electrical capacitance tomography (ECT). In this paper, key issues in designing high-speed ECT system including algorithms and circuits (small capacitance measurement module, data acquisition control module and communication module) are analyzed and discussed. To a great extent, the speed of hardware circuit depends on the performance of small capacitance measurement circuit. This paper presented ac-based and active differential capacitance measuring circuits, which are suitable for rapidly ECT imaging. The real time performances and image reconstruction process of ECT system are discussed. Key technology and methods for high-speed ECT system are given in this paper.

Citation Download Citation

Yanli Gao, Yonggao Zhang, and Weidong Wang "Design of high-speed electrical capacitance tomography system", Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 83343X (8 June 2012); https://doi.org/10.1117/12.968547

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