Paper
10 May 2012 Further development of artificial neural networks for spectral interference correction in optical emission spectrometry
Z. Li, S. Huang, V. Karanassios
Author Affiliations +
Abstract
Spectral overlaps causing spectral interference are a key concern in elemental analysis by optical emission spectrometry. Spectral interferences are addressed using a variety of methods, including artificial neural networks (ANNs). In my lab, these methods are being developed using both experimentally-obtained results and spectral simulations. ANNs are being developed for inductively coupled plasma-atomic emission spectrometry (ICP-AES) and for optical emission measurements using microplasmas and portable emission spectrometers. In this paper, the application of ANNS for spectral interference correction is described in some detail.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Z. Li, S. Huang, and V. Karanassios "Further development of artificial neural networks for spectral interference correction in optical emission spectrometry", Proc. SPIE 8401, Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering X, 84010Y (10 May 2012); https://doi.org/10.1117/12.919570
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spectroscopy

Spectrometers

Artificial neural networks

Network architectures

Neurons

Neural networks

Zinc

Back to Top