Extension of the measuring range in deformation measurement using artificial phase compensation

János Kornis; Richárd Séfel

doi:10.1117/12.978774

11 September 2012 Extension of the measuring range in deformation measurement using artificial phase compensation

János Kornis, Richárd Séfel

Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 84130E (2012) https://doi.org/10.1117/12.978774
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain

Abstract

Compensation or comparative measurement is a natural way to overcome the limited measuring range of TV holography or digital holography. In this case the resultant displacement field is the difference of the actual deformation and a known deformation pattern. The compensation can be digital, because these measuring techniques operate with images recorded with digital camera. Development of Spatial Light Modulators (SLM) enables the application of active holographic optical elements in coherent optical metrology. These modulators are capable to reconstruct digital holograms optically; therefore they can be used as active holographic optical elements. The goal of the project was to perform adaptive comparative measurements, where an optically reconstructed image of a recorded or simulated single or double exposure hologram is used for holographic illumination of another object. In this paper conventional TV holographic or digital holographic arrangement with holographic object illumination applied for comparative displacement measurement with adaptive features. Measurement setups were built, containing devices performing feedback, which is capable to project the real image of the master object - using its previously recorded or computer simulated digital holograms - onto the test object to calculate the difference deformation directly.

Citation Download Citation

János Kornis and Richárd Séfel "Extension of the measuring range in deformation measurement using artificial phase compensation", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84130E (11 September 2012); https://doi.org/10.1117/12.978774

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