Growth and characterization of high Nd-concentration single crystals LaxNd1-xPO4

Yongzheng Wang; Jing Li; Jiyang Wang; Shujuan Han; Yongjie Guo; Lanling Zhao; Yang Zhang

doi:10.1117/12.975923

15 October 2012 Growth and characterization of high Nd-concentration single crystals La_xNd_1-xPO₄

Yongzheng Wang, Jing Li, Jiyang Wang, Shujuan Han, Yongjie Guo, Lanling Zhao, Yang Zhang

Proceedings Volume 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy; 84191W (2012) https://doi.org/10.1117/12.975923
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

In this paper, La_xNd_1-xPO₄(x=0, 0.5, 0.8) series crystals with high Nd-concentration were grown through a seed-inducing method using Li₂CO₃-2MoO₃ as a flux, and some factors influencing the quality of crystals were also discussed. The IR, absorption and fluorescence spectra of La_0.5Nd_0.5PO₄ crystals at room temperature were measured. High temperature X-ray diffraction was conducted to investigate the thermal expansion behavior of NdPO₄ crystals in the temperature range from 25°C to 900°C. Abnormal diffraction peaks shifts were observed along the (200) and (020) direction. The results indicate that as temperature increased, the crystal in the (200) and (020) direction contracted (from 25 °C to 700 °C) at first, and then expanded (from 700°C to 900°C). The mechanism responsible for the abnormal thermal expansion in NdPO₄ was attributed to the existence of rigid unit modes (RUM).

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Yongzheng Wang, Jing Li, Jiyang Wang, Shujuan Han, Yongjie Guo, Lanling Zhao, and Yang Zhang "Growth and characterization of high Nd-concentration single crystals La_xNd_1-xPO₄", Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84191W (15 October 2012); https://doi.org/10.1117/12.975923

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KEYWORDS

Crystals

Single crystal X-ray diffraction

Temperature metrology

Diffraction

Neodymium

X-ray diffraction

Luminescence

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