Development of fast and high throughput tomography using CMOS image detector at SPring-8

Kentaro Uesugi; Masato Hoshino; Akihisa Takeuchi; Yoshio Suzuki; Naoto Yagi

doi:10.1117/12.929575

17 October 2012 Development of fast and high throughput tomography using CMOS image detector at SPring-8

Kentaro Uesugi, Masato Hoshino, Akihisa Takeuchi, Yoshio Suzuki, Naoto Yagi

Proceedings Volume 8506, Developments in X-Ray Tomography VIII; 85060I (2012) https://doi.org/10.1117/12.929575
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

A fast micro-tomography system and a high throughput micro-tomography system using state-of-the-art Complementary Metal Oxide Semiconductor (CMOS) imaging devices have been developed at SPring-8. Those systems adopt simple projection type tomography using synchrotron radiation X-ray. The fast micro-tomography system achieves a scan time around 2 s with 1000 projections, which is 15 times faster than previously developed system at SPring-8. The CMOS camera for fast tomography has 64 Giga Byte on-board memory, therefore, the obtained images must be transferred to a PC at the appropriate timing. A melting process of snow at room temperature was imaged every 30 s as a demonstration of the system. The high throughput tomography system adopts a scientific CMOS (sCMOS) camera with a low noise and high quantum efficiency. The system achieves a scan time around 5 minutes which is three times faster than before. The images quality of the system has been compared to the existing system with Charge-Coupled Device (CCD) camera. The results have shown the advantage of the new sCMOS camera.

Citation Download Citation

Kentaro Uesugi, Masato Hoshino, Akihisa Takeuchi, Yoshio Suzuki, and Naoto Yagi "Development of fast and high throughput tomography using CMOS image detector at SPring-8", Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 85060I (17 October 2012); https://doi.org/10.1117/12.929575

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