Paper
26 November 2012 Numerical simulation of polarization dependent characteristics of the structured thin-films phase grating
Yi Yu Li, Chuan Hu, Yu Chen Wu, Hai Hua Feng, Jiao Jie Chen
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Abstract
Diffraction efficiency of the structured thin-films phase grating (STFPG) at the visible wavelength is analyzed by the rigorous coupled wave analysis (RCWA) method demonstrating that the TM polarization can be separated from the 0th transmitted order of the TE polarization by ±1st order diffraction. The far field diffraction pattern is simulated by the finite-difference time-domain (FDTD) method to show the polarization beam splitting effect of the STFPG at wavelength of 633nm. In the near field, polarization dependent Talbot effect of the STFPG is also elaborated. FDTD simulations reveal that the spatial distribution of the interference fringes forming the self-image can be shifted by a half of grating period by changing the incident wave polarization within a particular wavelength range.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yi Yu Li, Chuan Hu, Yu Chen Wu, Hai Hua Feng, and Jiao Jie Chen "Numerical simulation of polarization dependent characteristics of the structured thin-films phase grating", Proc. SPIE 8556, Holography, Diffractive Optics, and Applications V, 85561D (26 November 2012); https://doi.org/10.1117/12.981858
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KEYWORDS
Polarization

Diffraction

Diffraction gratings

Thin films

Dielectric polarization

Finite-difference time-domain method

Refractive index

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