Paper
20 November 2012 Research of dynamic detecting the raw silk fineness on line by a linear CCD and FPGA
Feng-jiao Liu, Wang Zhou, Guo-qiang Chen, Hong gen Yi
Author Affiliations +
Abstract
A new design scheme has been proposed that aim to realize real time, on line raw silk diameter measurement based on linear CCD (Charge Coupled Device) and FPGA (Field Programmable Gate Array).In this system, the samples of raw silk are placed in parallel light which reflect light through macro imaging is received by CCD image sensor. The research on how to improve precision of the system from theoretical approach to various functional modules parameter optimization. What’s more, effects are solved in instability of light illumination and raw silk transparency, linear CCD's dark background imaging is chosen to avoid bright background image easily saturation, distortion caused by raw silk jitter is eliminated. system measurement accuracy reaches to±1μm,experimental results prove that research programme has certain feasibility and practicality.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Feng-jiao Liu, Wang Zhou, Guo-qiang Chen, and Hong gen Yi "Research of dynamic detecting the raw silk fineness on line by a linear CCD and FPGA", Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 85630W (20 November 2012); https://doi.org/10.1117/12.999269
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Cited by 2 scholarly publications.
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KEYWORDS
Charge-coupled devices

Imaging systems

CCD image sensors

Field programmable gate arrays

Signal processing

Signal to noise ratio

Video

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