Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry

J. F. Fernandez; O. D.D. Soares; M. Perez-Amor; J. Blanco

doi:10.1117/12.943505

1 June 1988 Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry

J. F. Fernandez, O. D.D. Soares, M. Perez-Amor, J. Blanco

Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943505
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France

Abstract

Moire deflectometry allows one to measure minor angular deflections experienced by light beams, previously collimated, in general,for an easier metrologic decoding. A novel technique is presented aiming at the measurement of curvature radius of polished spherical surfaces. Theoretical studies and experimental results are presented revealing satisfactory agreement, while the sources of errors of the measuring technique are analyzed in detail. The theoretical model is extended to cover the measurement of the focal distance in lenses.

Citation Download Citation

J. F. Fernandez, O. D.D. Soares, M. Perez-Amor, and J. Blanco "Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); https://doi.org/10.1117/12.943505

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