The range of VCSEL wearout reliability acceleration behavior and its effects on applications

James Guenter; Luke Graham; Bobby Hawkins; Robert Hawthorne; Ralph Johnson; Gary Landry; Jim Tatum

doi:10.1117/12.2002840

13 March 2013 The range of VCSEL wearout reliability acceleration behavior and its effects on applications

James Guenter, Luke Graham, Bobby Hawkins, Robert Hawthorne, Ralph Johnson, Gary Landry, Jim Tatum

Proceedings Volume 8639, Vertical-Cavity Surface-Emitting Lasers XVII; 86390I (2013) https://doi.org/10.1117/12.2002840
Event: SPIE OPTO, 2013, San Francisco, California, United States

Abstract

For nearly twenty years most models of VCSEL wearout reliability have incorporated Arrhenius activation energy near 0.7 eV, usually with a modest current exponent in addition. As VCSEL production extends into more wavelength, power, and speed regimes new active regions, mirror designs, and growth conditions have become necessary. Even at more traditional VCSEL 850-nm wavelengths instances of very different reliability acceleration factors have arisen. In some cases these have profound effects on the expected reliability under normal use conditions, resulting in wearout lifetimes that can vary more than an order of magnitude. These differences enable the extension of VCSELs in communications applications to even greater speeds with reliability equal to or even greater than the previous lowerspeed devices. This paper discusses some of the new applications, different wearout behaviors, and their implications in real-life operation. The effect of different acceleration behaviors on reliability testing is also addressed.

Citation Download Citation

James Guenter, Luke Graham, Bobby Hawkins, Robert Hawthorne, Ralph Johnson, Gary Landry, and Jim Tatum "The range of VCSEL wearout reliability acceleration behavior and its effects on applications", Proc. SPIE 8639, Vertical-Cavity Surface-Emitting Lasers XVII, 86390I (13 March 2013); https://doi.org/10.1117/12.2002840

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