The influence of mounting and thermal strains on defects disclose during ageing test for laser diodes for 808nm and 880nm bands

E. Dąbrowska; A. Kozłowska; M. Teodorczyk; J. Zawistowska; G. Sobczak; A. Maląg

doi:10.1117/12.2030184

25 July 2013 The influence of mounting and thermal strains on defects disclose during ageing test for laser diodes for 808nm and 880nm bands

E. Dąbrowska, A. Kozłowska, M. Teodorczyk, J. Zawistowska, G. Sobczak, A. Maląg

Author Affiliations +

Proceedings Volume 8902, Electron Technology Conference 2013; 890211 (2013) https://doi.org/10.1117/12.2030184
Event: Electron Technology Conference 2013, 2013, Ryn, Poland

Abstract

The quality of the die bonding is critical to the operation and reliability of the laser diodes since it can affect the electrical, thermal, and optical properties of the device. We investigated the effect of mounting induced strain and defects on the performance of high power laser. In this paper measurements of the temperature distribution, the spontaneous emission spectrum and the electroluminescence along the cavity of quantum well lasers are presented. The electro-optical parameters of the high output power laser diodes, such as emission wavelength, output power, threshold current, slope efficiency, and operating lifetime are presented too. In the experiment, high power diode lasers emitting in 808 nm and 880 nm- range are investigated. We have observed that defect lines tend to create in areas where temperature gradients were observed in thermovision measurements.

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E. Dąbrowska, A. Kozłowska, M. Teodorczyk, J. Zawistowska, G. Sobczak, and A. Maląg "The influence of mounting and thermal strains on defects disclose during ageing test for laser diodes for 808nm and 880nm bands", Proc. SPIE 8902, Electron Technology Conference 2013, 890211 (25 July 2013); https://doi.org/10.1117/12.2030184

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