Ray-tracing algorithm based on BRDF

Li Zheng; Hongxia Mao; Kaifeng Wu

doi:10.1117/12.2034938

11 September 2013 Ray-tracing algorithm based on BRDF

Li Zheng, Hongxia Mao, Kaifeng Wu

Proceedings Volume 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications; 890757 (2013) https://doi.org/10.1117/12.2034938
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

A new arithmetic is put forward for calculating the scattering of complicated rough surface, which based on ray-tracing with BRDF. When the direction of the incident ray is fixed, the direction of the reflected ray is decided by rejection/acceptance sampling, and the standard of rejection/acceptance sampling is based on the BRDF of the surface. The reflected rays well reflect the scattering character of the complicated rough surface when there are a great lot of incident rays. Integrating the BRDF of targets into traditional ray-tracing, it could calculate the scattering of complicated surface. The test result proves the practicability of the method.

Citation Download Citation

Li Zheng, Hongxia Mao, and Kaifeng Wu "Ray-tracing algorithm based on BRDF", Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890757 (11 September 2013); https://doi.org/10.1117/12.2034938

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KEYWORDS

Bidirectional reflectance transmission function

Data modeling

Reflection

Scattering

Detection and tracking algorithms

Reflectivity

Lithium

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