Reliability design of CMOS image sensor for space applications

Ning Xie; Shijun Chen; Yongping Chen

doi:10.1117/12.2034876

21 August 2013 Reliability design of CMOS image sensor for space applications

Ning Xie, Shijun Chen, Yongping Chen

Proceedings Volume 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications; 89082B (2013) https://doi.org/10.1117/12.2034876
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

In space applications, sensors work in very harsh space environment. Thus the reliability design must be carefully considered. This paper addresses the techniques which effectively increase the reliability of CMOS image sensors. A radiation tolerant pixel design which is implemented in a sun tracker sensor is presented. Measurement results of total dose radiation, SEL, SEU, etc prove the radiation immunity of the sensor.

Citation Download Citation

Ning Xie, Shijun Chen, and Yongping Chen "Reliability design of CMOS image sensor for space applications", Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89082B (21 August 2013); https://doi.org/10.1117/12.2034876

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