Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts

Patrick Andrae; Paul Fumagalli; Martina Schmid

doi:10.1117/12.2051760

1 May 2014 Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts

Patrick Andrae, Paul Fumagalli, Martina Schmid

Proceedings Volume 9132, Optical Micro- and Nanometrology V; 91320F (2014) https://doi.org/10.1117/12.2051760
Event: SPIE Photonics Europe, 2014, Brussels, Belgium

Abstract

We use scanning near-field optical microscopy (SNOM) to characterize different plasmonic-nanoparticle situations with high spatial and spectral resolution in this comparative study. The near-field enhancement is measured with an aperture probe (Al coated glass fiber) and two CCD spectrometers for simultaneous detection of reflection and transmission. The images of transmission and reflection show a correlation to the topography. We present a new way to access the relative absorption and discuss the results with consideration of artifact influences. Near-field enhancements are deeper understood by imaging isolated particles. This near field will be compared to measurements of random-particle distributions. Therefore, we will show normalized reflection and transmission images of random structures that lay the foundation for an absolute interpretation of near-field images. The normalization considers both the far-field UV/VIS results and a reference image of the substrate. The near-field reflection of nanoparticle arrays shows an enhancement of 25 %. In view of specific applications, particle distributions implemented in two ways: as far-field scatters and as near field enhancing objects.

Citation Download Citation

Patrick Andrae, Paul Fumagalli, and Martina Schmid "Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts", Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320F (1 May 2014); https://doi.org/10.1117/12.2051760

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