Focusing and photon flux measurements of the 2.88-nm radiation at the sample plane of the soft x-ray microscope, based on capillary discharge source

M. Fahad Nawaz; Alexandr Jancarek; Michal Nevrkla; Przemyslaw Wachulak; Jiri Limpouch; Ladislav Pina

doi:10.1117/12.2197154

12 May 2015 Focusing and photon flux measurements of the 2.88-nm radiation at the sample plane of the soft x-ray microscope, based on capillary discharge source

M. Fahad Nawaz, Alexandr Jancarek, Michal Nevrkla, Przemyslaw Wachulak, Jiri Limpouch, Ladislav Pina

Author Affiliations +

Proceedings Volume 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV; 951014 (2015) https://doi.org/10.1117/12.2197154
Event: SPIE Optics + Optoelectronics, 2015, Prague, Czech Republic

Abstract

Feasibility measurements leading to the development of a Soft X-ray (SXR) microscopy setup, based on capillary discharge XUV source is presented. Here the Z-pinching plasma is acting as a source of XUV radiation, emitting incoherent radiation in the “water-window” (λ = 2.3 – 4.4 nm) region of interest (natural contrast between the carbon and oxygen edges).This soft X-ray microscopy setup will realize imaging of the biological objects with high spatial resolution. The 2.88 nm radiation line is filtered out from the water-window band, and is focused by an axi-symmetric ellipsoidal mirror, coated with nickle. The focussed spot size is measured and reported. Flux measurements for the available number of photons (photons/pulse) at the sample plane has been carried out with AXUV PIN diode at the sample plane (slightly out of focus). For imaging, a fresnel zone plate lens will be used as an objective. The overall compact transmission SXR microscopy setup design is presented.

Citation Download Citation

M. Fahad Nawaz, Alexandr Jancarek, Michal Nevrkla, Przemyslaw Wachulak, Jiri Limpouch, and Ladislav Pina "Focusing and photon flux measurements of the 2.88-nm radiation at the sample plane of the soft x-ray microscope, based on capillary discharge source", Proc. SPIE 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV, 951014 (12 May 2015); https://doi.org/10.1117/12.2197154

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