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The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), “Title of Paper,” in Optical System Alignment, Tolerancing, and Verification IX, edited by José Sasián, Richard N. Youngworth, Proceedings of SPIE Vol. 9582 (SPIE, Bellingham, WA, 2015) Article CID Number. ISSN: 0277-786X ISBN: 9781628417487 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445 Copyright © 2015, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. AuthorsAuthors Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Aikens, David M., 02 Anctil, Geneviève, 0D Andersen, Torben B., 09, 0A Brunelle, Matthew, 04 Chang, Shenq-Tsong, 0I Chen, Fong-Zhi, 0I Côté, Patrice, 0D Desnoyers, Nichola, 0D Doucet, Michel, 0D Fang, Joyce, 0F Fornaroli, C., 0C Fuchs, U., 05 Gauvin, Jonny, 0D Gillner, A., 0C Hanft, Marco, 07 Ho, Cheng-Fong, 08 Holtkamp, J., 0C Hsu, Ming-Ying, 0I Hsu, Wei-Yao, 08 Huang, Chien-Yao, 08 Huang, Ting-Ming, 0I Kiontke, Sven R., 02 Lamontagne, Frédéric, 0D Lin, Wen-Lung, 08 Lin, Yu-Chuan, 0I Medicus, Kate, 04 Nelson, Jessica D., 04 Peng, Wei-Jei, 08 Rogers, John R., 06 Ryll, J., 0C Savransky, Dmitry, 0F Schweiger, Paul F., 09, 0A Silberman, Donn M., 0B Sivokon, V. P., 03 Youngworth, Richard N., 02 Yu, Zong-Ru, 08 Zibner, F., 0C Conference CommitteeProgram Track Chairs
Conference Chairs
Conference Program Committee
Session Chairs
IntroductionIt is with great pleasure that we write this introduction to the proceedings of a successful Optical System Alignment, Tolerancing, and Verification conference in 2015. This ninth conference showed signs of great change and increasing capability in the field. The optics and photonics community again bestowed upon us the honor of editing a set of excellent talks and posters into this proceedings volume. The attendance at our Sunday sessions showed that the conference topics are of current interest, useful, and of central importance to the community. This year’s conference had four great sessions. The opening session had many attendees interested in two papers on freeform optics and asphere tolerancing respectively. The second session continued the theme of tolerancing with discussions on slope sensitivities for optical surfaces, a tolerance analysis tutorialstyle paper, and a tolerance analysis paper for a transmission sphere. The first afternoon session had two linked alignment and verification papers for the key NIRCam instrument being integrated into the James Webb Space Telescope. The third talk provided an overview and hardware for alignment, tolerances, and metrology fundamentals at the nano and microscales. The last talk in the first afternoon session discussed a one micrometer adjustment for helical laser drilling. The fourth session concluded the oral conference program with a talk that gave an overview of lens mounting methods in the context of a new precision optical mounting method, state estimation in optical system alignment, and alignment estimation performance analysis for a three mirror anastigmat. The poster session had two papers total. The first paper covered an analysis of the alignment tolerance of a focal plane assembly in a telescope and the second discussed development of a large ground-based fast steering mirror assembly. The reader will enjoy and benefit from reading these papers. As chairs of a tight-knit and popular conference, we once again must humbly thank our program committee for the support they have continued to provide this conference. We are also grateful to all of the presenters for sharing their work, the audience for participating and helping to facilitate conversations at the conference, and to SPIE for providing us the opportunity to cover these important topics at Optical System Alignment, Tolerancing, and Verification IX in 2015. We are happy and excited to chair this conference again in 2016. We encourage everyone interested in any related research or development projects to please submit their work and attend the conference. Without great participation this conference would not have a strong tradition of keeping the important topics of alignment, tolerancing, and verification at the forefront of the optics and photonics conference. Please feel free to contact us or anyone on our program committee if you have any questions. We look forward to another successful conference in 2016. José Sasián Richard N. Youngworth |
