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22 September 2015 The observation of a transient surface morphology in the femtosecond laser ablation process by using the soft x-ray laser probe (Withdrawal Notice)
Noboru Hasegawa, Masaharu Nishikino, Takuro Tomita, Naofumi Ohnishi, Atsushi M. Ito, Takashi Eyama, Naoya Kakimoto, Rui Idutsu, Yasuo Minami, Motoyoshi Baba, Anatoly Y. Faenov, Nail A. Inogamov, Tetsuya Kawachi, Mitsuru Yamagiwa, Tohru Suemoto
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Proceedings Volume 9589, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI; 95890A (2015) https://doi.org/10.1117/12.2186744
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States
Abstract
This paper, originally published on September 22nd, 2015, was withdrawn per author request, if you have any questions please contact SPIE Digital Library Customer Service for assistance.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Noboru Hasegawa, Masaharu Nishikino, Takuro Tomita, Naofumi Ohnishi, Atsushi M. Ito, Takashi Eyama, Naoya Kakimoto, Rui Idutsu, Yasuo Minami, Motoyoshi Baba, Anatoly Y. Faenov, Nail A. Inogamov, Tetsuya Kawachi, Mitsuru Yamagiwa, and Tohru Suemoto "The observation of a transient surface morphology in the femtosecond laser ablation process by using the soft x-ray laser probe (Withdrawal Notice)", Proc. SPIE 9589, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI, 95890A (22 September 2015); https://doi.org/10.1117/12.2186744
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KEYWORDS
Picosecond phenomena
Laser ablation
X-rays
Sapphire lasers
Imaging systems
X-ray lasers
Reflectivity
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