Paper
19 July 2016 Submillimeter and far-infrared dielectric properties of thin films
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Abstract
The complex dielectric function enables the study of a material's refractive and absorptive properties and provides information on a material's potential for practical application. Commonly employed line shape profile functions from the literature are briefly surveyed and their suitability for representation of dielectric material properties are discussed. An analysis approach to derive a material's complex dielectric function from observed transmittance spectra in the far-infrared and submillimeter regimes is presented. The underlying model employed satisfies the requirements set by the Kramers-Kronig relations. The dielectric function parameters derived from this approachtypically reproduce the observed transmittance spectra with an accuracy of < 4%.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giuseppe Cataldo and Edward J. Wollack "Submillimeter and far-infrared dielectric properties of thin films", Proc. SPIE 9914, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII, 99142W (19 July 2016); https://doi.org/10.1117/12.2232648
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Cited by 2 scholarly publications.
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KEYWORDS
Dielectrics

Data modeling

Oscillators

Infrared radiation

Transmittance

Absorption

Dielectric polarization

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