High temperature stability testing of Ge-doped and F-doped Fabry-Perot fibre optical sensors

Dimitrios Polyzos; Jinesh Mathew; William N. MacPherson; Robert R .J. Maier

doi:10.1117/12.2235794

30 May 2016 High temperature stability testing of Ge-doped and F-doped Fabry-Perot fibre optical sensors

Dimitrios Polyzos, Jinesh Mathew, William N. MacPherson, Robert R .J. Maier

Proceedings Volume 9916, Sixth European Workshop on Optical Fibre Sensors; 991604 (2016) https://doi.org/10.1117/12.2235794
Event: Sixth European Workshop on Optical Fibre Sensors (EWOFS'2016), 2016, Limerick, Ireland

Abstract

We present high temperature (~1100°C) stability tests of, Ge-doped and F-doped, optical fibre sensors. Our analysis includes the variation in their behaviours within high temperature environments and how the dopant diffusion affects their long term stability.

Citation Download Citation

Dimitrios Polyzos, Jinesh Mathew, William N. MacPherson, and Robert R .J. Maier "High temperature stability testing of Ge-doped and F-doped Fabry-Perot fibre optical sensors", Proc. SPIE 9916, Sixth European Workshop on Optical Fibre Sensors, 991604 (30 May 2016); https://doi.org/10.1117/12.2235794

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available