Image-based characterization of microfocus x-ray target failure

Vance S. Robinson; Thomas Raber; William R. Ross

doi:10.1117/12.2238968

16 September 2016 Image-based characterization of microfocus x-ray target failure

Vance S. Robinson, Thomas Raber, William R. Ross

Proceedings Volume 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V; 996405 (2016) https://doi.org/10.1117/12.2238968
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

X-ray targets in microfocus x-ray tubes fail primarily due to sublimation and evaporation of tungsten while exposed to the electron beam. The temperature at the point of impact of the electron beam depends on the beam energy (200-300 kV), the beam current (<10 mA), the cross section (<1 mm) and the intensity profile. In order to preserve the target for a reasonable lifetime, temperatures at the spot do not typically exceed 2500 C. As tungsten evaporates from the surface of the target, the surface starts to pit and this can affect the x-ray production in multiple ways: the photon flux decreases, the heel effect is enhanced, the effective spot size changes shape and/or size. Indirectly, the target damage incurred over time or due to intense use will undermine the image quality by reducing image contrast, changing the resolution or degrading the signal to noise ratio. A detailed description of how x-ray target damage is incurred and the potential impact on image quality is reviewed in detail. Experimental results showing the target damage and associated loss of image quality are discussed.

Conference Presentation

Citation Download Citation

Vance S. Robinson, Thomas Raber, and William R. Ross "Image-based characterization of microfocus x-ray target failure", Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 996405 (16 September 2016); https://doi.org/10.1117/12.2238968

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