Presentation
5 March 2022 Optimization of tunnel junction growth on m-plane GaN substrate for multi-quantum shell-based devices
Shiori Yamamura, Yoshiya Miyamoto, Naoki Sone, Weifang Lu, Renji Okuda, Kazuma Ito, Yukimi Jinno, Nanami Nakayama, Sae Katsuro, Satoshi Kamiyama, Tetsuya Takeuchi, Motoaki Iwaya
Author Affiliations +
Abstract
Current injection through tunnel junctions (TJs) can enhance the external quantum efficiency of nanowire (NW) and multi-quantum-shell-based optical devices, compared. However, control of the impurity concentration profile is difficult in such tiny structure. In this study, we show a simple evaluation method of impurities in TJs growing flatly on m-plane GaN substrates, which have the same crystalline orientation as the luminescent surface of MQS/NWs. It was found to decrease the differential resistance by increase the concentration of Mg in p^(++)-GaN in the TJ.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiori Yamamura, Yoshiya Miyamoto, Naoki Sone, Weifang Lu, Renji Okuda, Kazuma Ito, Yukimi Jinno, Nanami Nakayama, Sae Katsuro, Satoshi Kamiyama, Tetsuya Takeuchi, and Motoaki Iwaya "Optimization of tunnel junction growth on m-plane GaN substrate for multi-quantum shell-based devices", Proc. SPIE PC12001, Gallium Nitride Materials and Devices XVII, PC1200109 (5 March 2022); https://doi.org/10.1117/12.2608402
Advertisement
Advertisement
KEYWORDS
Gallium nitride

Magnesium

Doping

Ions

Mass spectrometry

Nanowires

Oxides

RELATED CONTENT

Sputtering growth of n++ GaN shell in the tunnel junction...
Proceedings of SPIE (January 01 1900)
HCDI performance of Na 2x3 and Na 2x4 nanowires for...
Proceedings of SPIE (September 09 2019)
Characteristics of n-GaN after ICP etching
Proceedings of SPIE (September 17 2002)
Doped gallium oxide nanowires for photonics
Proceedings of SPIE (February 29 2012)

Back to Top