Influence of forward-current stress on the generation of deep-level traps in InGaN/GaN blue micro-LEDs

A. B. M. Hamidul Islam; Tae Kyoung Kim; Yu-Jung Cha; Jae Won Seo; Jiun Oh; Jong-In Shim; Dong-Soo Shin; Joon Seop Kwak

doi:10.1117/12.2655656

21 March 2023 Influence of forward-current stress on the generation of deep-level traps in InGaN/GaN blue micro-LEDs

A. B. M. Hamidul Islam, Tae Kyoung Kim, Yu-Jung Cha, Jae Won Seo, Jiun Oh, Jong-In Shim, Dong-Soo Shin, Joon Seop Kwak

Proceedings Volume PC12421, Gallium Nitride Materials and Devices XVIII; (2023) https://doi.org/10.1117/12.2655656
Event: SPIE OPTO, 2023, San Francisco, California, United States

Conference Poster

Abstract

This conference poster presentation was prepared for the Photonics West OPTO 2023 Symposium.

Citation Download Citation

A. B. M. Hamidul Islam, Tae Kyoung Kim, Yu-Jung Cha, Jae Won Seo, Jiun Oh, Jong-In Shim, Dong-Soo Shin, and Joon Seop Kwak "Influence of forward-current stress on the generation of deep-level traps in InGaN/GaN blue micro-LEDs", Proc. SPIE PC12421, Gallium Nitride Materials and Devices XVIII, (21 March 2023); https://doi.org/10.1117/12.2655656

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