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6 October 2023 Investigation of x-ray Hartmann wavefront sensing: from simulation to the initial experiment test
Lei Huang, Tianyi Wang, Oleg Chubar, Guillaume Dovillaire, An He, Max S. Rakitin, Yang Yang, Andrew M. Kiss, Mourad Idir
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Proceedings Volume PC12697, Advances in Computational Methods for X-Ray Optics VI; PC1269705 (2023) https://doi.org/10.1117/12.2675754
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States
Abstract
We introduce an X-ray Hartmann Wavefront Sensor (HWS) simulation tool developed under the Synchrotron Radiation Workshop (SRW) framework. This metrology package can mimic an in-situ wavefront measurement experiment with a particular beamline optical layout, predict the expected Hartmanngrams, and then give access to the wavefront results under different beamline configurations. From the HWS design point of view, this SRW HWS simulation tool can be used to optimize the wavefront sensor parameters, such as the size and pitch of the Hartmann mask and the distance between the mask and the detector, in a specific X-ray energy range and help to tolerance complicated optical setup. Besides the X-ray HWS simulation in SRW, we also address some initial tests of a hard X-ray HWS under development at NSLS-II. Initial tests can be performed to evaluate the basic functionality of the X-ray HWS, such as the measurement repeatability and sensitivity to beam imperfections. It can provide a comprehensive evaluation of the performance of an X-ray HWS and help to optimize its design and functionality as a diagnostic tool for specific research questions and experimental conditions.
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(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Lei Huang, Tianyi Wang, Oleg Chubar, Guillaume Dovillaire, An He, Max S. Rakitin, Yang Yang, Andrew M. Kiss, and Mourad Idir "Investigation of x-ray Hartmann wavefront sensing: from simulation to the initial experiment test", Proc. SPIE PC12697, Advances in Computational Methods for X-Ray Optics VI, PC1269705 (6 October 2023); https://doi.org/10.1117/12.2675754
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KEYWORDS
X-rays
Wavefront sensors
Wavefronts
Diagnostics
Computer simulations
Design and modelling
Imperfections
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