Application of the time-of-flight method for straylight characterization in optical calibration facilities: application to the NAC instrument

Lionel Clermont; Pascal Blain; Emmanuel Mazy; Wassim Khaddour; Wilfried Uhring; Marc P. Georges

doi:10.1117/12.3021571

18 June 2024 Application of the time-of-flight method for straylight characterization in optical calibration facilities: application to the NAC instrument

Lionel Clermont, Pascal Blain, Emmanuel Mazy, Wassim Khaddour, Wilfried Uhring, Marc P. Georges

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Proceedings Volume PC12996, Unconventional Optical Imaging IV; PC1299611 (2024) https://doi.org/10.1117/12.3021571
Event: SPIE Photonics Europe, 2024, Strasbourg, France

Abstract

Straylight (SL) characterization using ultrafast time of flight imaging (ToF) has been demonstrated for the testing of refractive telescopes, using a streak tube with a femtosecond laser. It was shown that individual SL contributors such as different ghost reflections and scattering features can be measured individually and identified by temporal discrimination due to the specific optical path length of each of them. This allows to analyze them individually for a better understanding of straylight properties in instruments. Recently, we have used the ToF approach to characterize a testing facility that was then used in the frame of the calibration campaign for the Narrow Angle Camera (NAC) of the Earth Return Orbiter mission. The facility itself could generate its own SL that has to be retrieved from that coming from the instrument. Due to the large facility dimensions, optical path lengths can be discriminated by using a low temporal resolution that is enabled by picosecond lasers associated to a SPAD detector. At the end, the SL coming from the facility can be reverse engineered to find its origin and either removed by facility adaptation or by processing.

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Lionel Clermont, Pascal Blain, Emmanuel Mazy, Wassim Khaddour, Wilfried Uhring, and Marc P. Georges "Application of the time-of-flight method for straylight characterization in optical calibration facilities: application to the NAC instrument", Proc. SPIE PC12996, Unconventional Optical Imaging IV, PC1299611 (18 June 2024); https://doi.org/10.1117/12.3021571

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KEYWORDS

Equipment

Optical calibration

Beam path

Reflection

Reverse engineering

Sensors

Telescopes

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