Open Access
12 August 2016 Three-dimensional patterning in polymer optical waveguides using focused ion beam milling
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Abstract
Waveguide (WG) photonic-bridge taper modules are designed for symmetric planar coupling between silicon WGs and single-mode fibers (SMFs) to minimize photonic chip and packaging footprint requirements with improving broadband functionality. Micromachined fabrication and evaluation of polymer WG tapers utilizing high-resolution focused ion beam (FIB) milling is performed and presented. Polymer etch rates utilizing the FIB and optimal methods for milling polymer tapers are identified for three-dimensional patterning. Polymer WG tapers with low sidewall roughness are manufactured utilizing FIB milling and optically tested for fabrication loss. FIB platforms utilize a focused beam of ions (Ga+) to etch submicron patterns into substrates. Fabricating low-loss polymer WG taper prototypes with the FIB before moving on to mass-production techniques provides theoretical understanding of the polymer taper and its feasibility for connectorization devices between silicon WGs and SMFs.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Kevin Kruse, Derek Burrell, and Christopher Middlebrook "Three-dimensional patterning in polymer optical waveguides using focused ion beam milling," Journal of Micro/Nanolithography, MEMS, and MOEMS 15(3), 034505 (12 August 2016). https://doi.org/10.1117/1.JMM.15.3.034505
Published: 12 August 2016
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CITATIONS
Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Polymers

Etching

Ion beams

Polymer multimode waveguides

Waveguides

Optical lithography

Gallium

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