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This PDF file contains the editorial “Book Rvw: Interferogram Analysis: Digital Fringe Pattern Measurement Techniques," by David W. Robinson and Graeme T. Reid for OE Vol. 32 Issue 11
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James C. Wyant, "Book Review: Interferogram Analysis: Digital Fringe Pattern Measurement Techniques. By David W. Robinson and Graeme T. Reid," Opt. Eng. 32(11) (1 November 1993) https://doi.org/10.1117/1.OE.32.11.bookreviews