Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light

Mufei Xiao; Xin Chen

doi:10.1117/1.1287324

1 September 2000 Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light

Mufei Xiao, Xin Chen

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Optical Engineering, Vol. 39, Issue 9, (September 2000). https://doi.org/10.1117/1.1287324

We present a numerical comparison between shear-force, constant-height, and constant-intensity images in scanning near-field optical microscopy. We demonstrate the general difference between the three imaging modes. Two types of incident light are tested, with polarization perpendicular and parallel to the mean plane of the surface. Merits and demerits of the three images are discussed.

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Mufei Xiao and Xin Chen "Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light," Optical Engineering 39(9), (1 September 2000). https://doi.org/10.1117/1.1287324

Published: 1 September 2000

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