Measuring the illumination angle of a flatbed scanner

Tuck Wah Ng; Armita Tajuddin

doi:10.1117/1.1347030

1 March 2001 Measuring the illumination angle of a flatbed scanner

Tuck Wah Ng, Armita Tajuddin

Optical Engineering, Vol. 40, Issue 3, (March 2001). https://doi.org/10.1117/1.1347030

Flatbed scanners are increasingly used for scientific applications in which accurate determination of the scanner's illumination angle is often needed. A measurement method based on a dual-photodiode arrangement is proposed and demonstrated. The measurements obtained from experimental verification are found to be repeatable. The technique is also fast and easy to implement.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Tuck Wah Ng and Armita Tajuddin "Measuring the illumination angle of a flatbed scanner," Optical Engineering 40(3), (1 March 2001). https://doi.org/10.1117/1.1347030

Published: 1 March 2001

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available