1 March 2011 Lateral and axial resolutions of an angle-deviation microscope for different numerical apertures: experimental results
Ming-Hung Chiu, Chin-Fa Lai, Chen-Tai Tan, Yi-Zhi Lin
Author Affiliations +
Abstract
This paper presents a study of the lateral and axial resolutions of a transmission laser-scanning angle-deviation microscope (TADM) with different numerical aperture (NA) values. The TADM is based on geometric optics and surface plasmon resonance principles. The surface height is proportional to the phase difference between two marginal rays of the test beam, which is passed through the test medium. We used common-path heterodyne interferometry to measure the phase difference in real time, and used a personal computer to calculate and plot the surface profile. The experimental results showed that the best lateral and axial resolutions for NA = 0.41 were 0.5 μm and 3 nm, respectively, and the lateral resolution breaks through the diffraction limits.
©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Ming-Hung Chiu, Chin-Fa Lai, Chen-Tai Tan, and Yi-Zhi Lin "Lateral and axial resolutions of an angle-deviation microscope for different numerical apertures: experimental results," Optical Engineering 50(3), 033204 (1 March 2011). https://doi.org/10.1117/1.3553007
Published: 1 March 2011
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Atomic force microscopy

Microscopes

Sensors

Confocal microscopy

Objectives

Diffraction

Phase measurement

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