Open Access
25 July 2017 Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry
Carlos Gomez, Rong Su, Adam Thompson, Jack DiSciacca, Simon Lawes, Richard K. Leach
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Abstract
Surface topography measurement for metal additive manufacturing (AM) is a challenging task for contact and noncontact methods. We present an experimental investigation of the use of coherence scanning interferometry (CSI) for measuring AM surfaces. Our approach takes advantage of recent technical enhancements in CSI, including high dynamic range for light level and adjustable data acquisition rates for noise reduction. The investigation covers several typical metal AM surfaces made from different materials and AM processes. Recommendations for measurement optimization balance three aspects: data coverage, measurement area, and measurement time. This study also presents insight into areas of interest for future rigorous examination, such as measuring noise and further development of guidelines for measuring metal AM surfaces.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Carlos Gomez, Rong Su, Adam Thompson, Jack DiSciacca, Simon Lawes, and Richard K. Leach "Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry," Optical Engineering 56(11), 111714 (25 July 2017). https://doi.org/10.1117/1.OE.56.11.111714
Received: 7 April 2017; Accepted: 10 July 2017; Published: 25 July 2017
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CITATIONS
Cited by 60 scholarly publications and 1 patent.
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