14 July 2018 Nonscanning three-dimensional measurement by structured illumination sectioning microscopy
Tong Wang, Tao Liu, Shuming Yang, Qiang Liu, Yiming Wang
Author Affiliations +
Abstract
To achieve nonscanning three-dimensional measurement of microstructures, the optically sectioning mechanism has been used based on the structured illumination microscopy. The key point is to implement nonscanning measurement within a limited axial range according to the measured one-sided linear response curve. One-dimensional transmission grating pattern was projected onto the sample, and optically sectioned images were extracted from three-step phase-shifting manipulation. Compared with the basic and differential confocal microscopy, the described method does not need time-consuming axial scanning, so it greatly improves the measurement efficiency. The results show that the described method is useful in the fields of micromechanics, microelectronics, and biomedicine.
© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2018/$25.00 © 2018 SPIE
Tong Wang, Tao Liu, Shuming Yang, Qiang Liu, and Yiming Wang "Nonscanning three-dimensional measurement by structured illumination sectioning microscopy," Optical Engineering 57(7), 074104 (14 July 2018). https://doi.org/10.1117/1.OE.57.7.074104
Received: 23 April 2018; Accepted: 20 June 2018; Published: 14 July 2018
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Microscopy

Confocal microscopy

3D microstructuring

Microscopes

Optical design

3D metrology

3D scanning

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