Dr. Jérome Idier
at Ecole Centrale de Nantes
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 May 2022 Presentation
Proceedings Volume PC12144, PC121440J (2022) https://doi.org/10.1117/12.2624255
KEYWORDS: Reflection, Microscopy, Luminescence, Image resolution, Microscopes, Calibration, Super resolution, Speckle pattern, Signal to noise ratio, Scattering

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