Here we present the results of investigations aimed at the development and testing of robust, chemically inert single-crystal diamond probes for atomic force microscopy (AFM). The probes were prepared by assembling common silicon probes with micrometer-sized pyramid-shaped single-crystal diamonds (SCD). The SCD were obtained by the selective thermal oxidation of the polycrystalline films grown by chemical vapor deposition. Electrostatic spray of adhesive coating onto silicon probes was used to attach individual SCD. Geometrical parameters of produced AFM SCD probes were revealed with transmission electron microscopy: the apex angle of the pyramidal diamond crystallite was , and the curvature radius at the apex was to 10 nm. The diamond AFM probes were used for surface imaging of deoxyribonucleic acid deposited on graphite substrate. Obtained results demonstrate high efficiency of the diamond AFM probes, allowing improvement of the image quality compared to standard silicon probes.