Optical Heterodyne Microscopy Of The Interferometric Objects

Yoichi Fujii

doi:10.1117/12.936125

15 April 1983 Optical Heterodyne Microscopy Of The Interferometric Objects

Yoichi Fujii

Proceedings Volume 0422, 10th Intl Optical Computing Conf; (1983) https://doi.org/10.1117/12.936125
Event: 10th International Optical Computing Conference, 1983, Cambridge, United States

Abstract

A new unconventional principle of the imaging of the interferometric microscopic objects by using the optical heterodyne detection is proposed and experimentally verified. 1. Principle The optical heterodyne detection is used in imaging devices not only for the photodetector but also for the imaging. A new priciple of the ptical heterodyne is proposed by one of the author '. The optical heterodyne detection with the point reference (local) light source, whose optical frequency is shifted by an optical frequency translater, detects only the point source at the same position of the mirror image of the reference source. Thus by the scanning three-dimensionally the reference point source, an image of the object is obtained. In this system, the frequency translater generates both sidebands to the carrier optical frequency, the beat frequencies from both sideband in the output of the photodetector interferes with each other at the output of the photo-detector, and so the optical phase difference is converted into the phase difference of the resulted beat-frequency signal. Thus the interferometric image of the objects is obtained. In this case, the fringe spacing is half of that of the interferometer.

Citation Download Citation

Yoichi Fujii "Optical Heterodyne Microscopy Of The Interferometric Objects", Proc. SPIE 0422, 10th Intl Optical Computing Conf, (15 April 1983); https://doi.org/10.1117/12.936125

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KEYWORDS

Heterodyning

Interferometry

Microscopes

Photodetectors

Light scattering

Particles

Scattering

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