Industrial Applications of Fourier Transform Infrared Spectroscopy

A. Ishitani

doi:10.1117/12.970712

20 December 1985 Industrial Applications of Fourier Transform Infrared Spectroscopy

A. Ishitani

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970712
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

The latest advancement and potentiality of FT-IR as a tool for industrial materials characterization are reviewed. The position and advantages of FT-IR among other analytical techniques are also discussed, especially in surface and microanalyses. Several examples of FT-IR applications being done in TRC are presented. A study on bilayer membranes with embedded polypeptides, dispersed in water is shown as an example of bulk analysis. Surface analysis of an oxide layer on a silicon wafer by ATR using the wafer itself as an IRE plate is explained. Potentiality of PAS for a deep sampling probe on multilayered composition is illustrated. Finally the present stage of FT-IR microanalysis using an infrared microscope is discussed using examples on real samples.

Citation Download Citation

A. Ishitani "Industrial Applications of Fourier Transform Infrared Spectroscopy", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970712

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