Paper
1 September 1987 Photoemissive Probing Of High-Speed Signals
A. M. Weiner, P. S. D. Lin, R. B. Marcus, J. Orloff
Author Affiliations +
Abstract
High-speed electrical signals on any semiconductor device or circuit are probed by generation of short (80 fs) pulses of photoelectrons at the point of measurement; and performing an energy analysis of the emitted electrons. A temporal resolution of 5.3 ps has been achieved on a photoconductive signal generated on a 5 μm co-planar strip line.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. M. Weiner, P. S. D. Lin, R. B. Marcus, and J. Orloff "Photoemissive Probing Of High-Speed Signals", Proc. SPIE 0774, Lasers in Microlithography, (1 September 1987); https://doi.org/10.1117/12.940390
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Cited by 1 scholarly publication.
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KEYWORDS
Picosecond phenomena

Temporal resolution

Electrons

Electrodes

Signal generators

Semiconductors

Gold

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