Single-shot spatio-temporal measurement of relativistic electron beams by electro-optic sampling

M. Ota; K. Kan; Y. Wang; V. C. Agulto; Y. Arikawa; M. R. Asakawa; Y. Sakawa; T. Matsui; M. Nakajima

doi:10.1117/12.3005230

12 March 2024 Single-shot spatio-temporal measurement of relativistic electron beams by electro-optic sampling

M. Ota, K. Kan, Y. Wang, V. C. Agulto, Y. Arikawa, M. R. Asakawa, Y. Sakawa, T. Matsui, M. Nakajima

Proceedings Volume 12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX; 1287006 (2024) https://doi.org/10.1117/12.3005230
Event: SPIE LASE, 2024, San Francisco, California, United States

Abstract

Beam monitoring of relativistic charged particle beams is of great interest for various applications including a high-order harmonic generation-seeded free-electron-laser. In particular, in phenomena with low repeatability/reproducibility such as laser-plasma acceleration experiments, it is important to measure spatio-temporal density profile of accelerated charged particle beams in a single shot. In this research, single-shot ultrafast spatio-temporal density profile measurement of relativistic electron beams in radiofrequency accelerators is conducted via obtaining spatio-temporal electric-field profile around the beams with combination of electro-optic sampling and echelon-based single-shot method. Here, we introduced an analytical model derived by special relativistic electromagnetism to deduce longitudinal and transverse beam sizes by measured spatio-temporal electric-field profiles.

Conference Presentation

Citation Download Citation

M. Ota, K. Kan, Y. Wang, V. C. Agulto, Y. Arikawa, M. R. Asakawa, Y. Sakawa, T. Matsui, and M. Nakajima "Single-shot spatio-temporal measurement of relativistic electron beams by electro-optic sampling", Proc. SPIE 12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX, 1287006 (12 March 2024); https://doi.org/10.1117/12.3005230

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