Retroreflector diffraction modeling

Sacha Loiseau; Stuart B. Shaklan; David C. Redding; Edouard G. Schmidtlin

doi:10.1117/12.317186

24 July 1998 Retroreflector diffraction modeling

Sacha Loiseau, Stuart B. Shaklan, David C. Redding, Edouard G. Schmidtlin

Proceedings Volume 3350, Astronomical Interferometry; (1998) https://doi.org/10.1117/12.317186
Event: Astronomical Telescopes and Instrumentation, 1998, Kona, HI, United States

Abstract

The SIM metrology subsystem utilizes cornercube retroreflectors as fiducials. These components will introduce errors in the metrology output that must be quantified. Eventually, a complete modeling of the metrology subsystem will be needed. For that purpose, we are developing an optical model for a cornercube retroreflector, taking into account most of the defects present in such an optical part. Our goal is to given a phase map of the wavefront produced by the interference of the reference beam and the metrology beam. Our first step towards this goal is the construction of an optical model and its validation, using the MACOS and VSIM packages.

Citation Download Citation

Sacha Loiseau, Stuart B. Shaklan, David C. Redding, and Edouard G. Schmidtlin "Retroreflector diffraction modeling", Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); https://doi.org/10.1117/12.317186

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