Paper
19 July 2000 Mask cleaner innovation
Hidehiro Watanabe, Kenji Masui, Akio Kosaka, Naoya Hayamizu, Akinori Iso, Hachiro Hiratsuka, Yoshiaki Minegishi, Fumiaki Shigemitsu
Author Affiliations +
Abstract
A new clustered configurational photomask cleaning system has been developed. Accepting the clustered configuration, we can be free from the heavy tank photomask cleaner which has a large footprint and has no flexibility for designing a cleaning recipe. Provided we need to introduce a new cleaning process unit, we can substitute the unit by disassembling an old one in the system. We can always keep our photomask cleaner up-to date with the system, and, we can obtain most effective cleaning result by the least efforts and the smallest expense. Using this cleaning system with an optimized cleaning recipe, we have achieved the cleaning result of less than one particle, greater than 0.2 micrometers , detected by KLA Starlight.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hidehiro Watanabe, Kenji Masui, Akio Kosaka, Naoya Hayamizu, Akinori Iso, Hachiro Hiratsuka, Yoshiaki Minegishi, and Fumiaki Shigemitsu "Mask cleaner innovation", Proc. SPIE 4066, Photomask and Next-Generation Lithography Mask Technology VII, (19 July 2000); https://doi.org/10.1117/12.392045
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KEYWORDS
Photomasks

Ultraviolet radiation

Particles

Contamination

Mask cleaning

Mechatronics

Control systems

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