Two-dimensional optical measurement techniques based on optic birefringence effects

Yongchang Zhu; Tatsuo Takada; Yoshihiro Murooka

doi:10.1117/12.440281

18 September 2001 Two-dimensional optical measurement techniques based on optic birefringence effects

Yongchang Zhu, Tatsuo Takada, Yoshihiro Murooka

Proceedings Volume 4556, Data Mining and Applications; (2001) https://doi.org/10.1117/12.440281
Event: Multispectral Image Processing and Pattern Recognition, 2001, Wuhan, China

Abstract

Some dielectric materials may become birefringent when subjected to an external force, such as an electric field or a mechanical force. For more than a decade, our research group has been engaged in developing 2D optical measurement techniques for the dynamic measurement of charge distributions on a dielectric surface using the electro- optic Pockels effect, the dynamic measurement of electrical field distributions in a liquid using the electro-optic Kerr effect and the measurement of birefringence vector distributions in plastic plates using the photo-elastic effect. The common image processing techniques that are uniquely developed in our work are analyzed and summarized.

Citation Download Citation

Yongchang Zhu, Tatsuo Takada, and Yoshihiro Murooka "Two-dimensional optical measurement techniques based on optic birefringence effects", Proc. SPIE 4556, Data Mining and Applications, (18 September 2001); https://doi.org/10.1117/12.440281

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