Paper
13 October 2006 Research on pitch analysis methods for calibration of one-dimensional grating standard based on nanometrological AFM
Qiangxian Huang, Satoshi Gonda, Ichiko Misumi, Taeho Keem, Tomizo Kurosawa
Author Affiliations +
Proceedings Volume 6280, Third International Symposium on Precision Mechanical Measurements; 628007 (2006) https://doi.org/10.1117/12.715251
Event: Third International Symposium on Precision Mechanical Measurements, 2006, Urumqi, China
Abstract
By present, the calibration of dimensions in nano scale is being paid more and more attentions. One-dimensional grating standard with pitches in nano-scale is being proposed by the CCL-WGDM 7 to be one of the five key comparison parameters in the emerging field of nanometrology. In the pitch calibration of grating standard, Gravity Center Method and Zero-Cross Points Method are proposed. The two methods are analyzed and simulated under different conditions. Based on the actual measurement data obtained by AFM, the two methods are used and the best value is determined. The results in the paper are useful to pitch calibration in nano scale.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qiangxian Huang, Satoshi Gonda, Ichiko Misumi, Taeho Keem, and Tomizo Kurosawa "Research on pitch analysis methods for calibration of one-dimensional grating standard based on nanometrological AFM", Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 628007 (13 October 2006); https://doi.org/10.1117/12.715251
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Cited by 3 scholarly publications.
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KEYWORDS
Atomic force microscopy

Calibration

Analytical research

Interferometers

Data analysis

Standards development

Data centers

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