Measurement and analysis of microwave frequency response of semiconductor optical amplifiers

Jian Liu; Shang-Jian Zhang; Yong-Hong Hu; Liang Xie; Yong-Zhen Huang; Ning-Hua Zhu

doi:10.1117/12.757119

7 January 2008 Measurement and analysis of microwave frequency response of semiconductor optical amplifiers

Jian Liu, Shang-Jian Zhang, Yong-Hong Hu, Liang Xie, Yong-Zhen Huang, Ning-Hua Zhu

Proceedings Volume 6824, Semiconductor Lasers and Applications III; 682406 (2008) https://doi.org/10.1117/12.757119
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

The measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (SOAs) are proposed in this paper. The response is measured using a vector network analyzer. Then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the SOA is extracted. Some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. The multisectional model of an SOA is then used to analyze the response theoretically. By deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. Then by iterating the expression, the response of the whole SOA is simulated. The simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. This proves the validity of the theoretical analysis.

Citation Download Citation

Jian Liu, Shang-Jian Zhang, Yong-Hong Hu, Liang Xie, Yong-Zhen Huang, and Ning-Hua Zhu "Measurement and analysis of microwave frequency response of semiconductor optical amplifiers", Proc. SPIE 6824, Semiconductor Lasers and Applications III, 682406 (7 January 2008); https://doi.org/10.1117/12.757119

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