Paper
5 September 2008 High spatial resolution x-ray mapping of CdZnTe detectors
Author Affiliations +
Abstract
CdZnTe (CZT) is the most promising semiconductor for room-temperature nuclear radiation detectors. At Brookhaven's National Synchrotron Light Source (NSLS), we used a highly collimated synchrotron X-ray radiation to map different CZT detectors. In this paper, the latest results from high spatial resolution X-ray mapping of CZT detectors are reported. Effects of different internal defects on the performance of CZT detectors are discussed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Yang, A. E. Bolotnikov, G. S. Camarda, Y. Cui, A. Hossain, and R. B. James "High spatial resolution x-ray mapping of CdZnTe detectors", Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70791D (5 September 2008); https://doi.org/10.1117/12.796595
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KEYWORDS
X-rays

Tellurium

Sensors

X-ray detectors

Semiconducting wafers

Sensor performance

Spatial resolution

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