Paper
10 September 2009 Chromatic confocal spectral interferometry for technical surface characterization
Author Affiliations +
Abstract
Chromatic confocal spectral interferometry (CCSI) is a hybrid method for fast topography measurement, which combines the advantages of the interferometric gain and accuracy with the robustness of confocal microscopy. The CCSI-principle provides a single shot measurement of depth while offering a higher lateral resolution than commonly used spectral interferometers. This contribution is focused on the modeling and simulation of a CCSI-sensor for measuring rough surfaces, based on sequential and non-sequential ray-tracing. With the simulation, the influence of surface roughness, surface reflectivity, and surface contamination on reliability of the sensor can be estimated.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Lyda, D. Fleischle, T. Haist, and W. Osten "Chromatic confocal spectral interferometry for technical surface characterization", Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320Z (10 September 2009); https://doi.org/10.1117/12.826902
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Confocal microscopy

Interferometry

Colorimetry

Data modeling

Mirrors

Interferometers

Back to Top