Control of the point defects in oxide materials to enhance functionalities in imaging

B. Viana; Th. Maldiney; S. Blahuta; A. Béssière; D. Gourier; C. Richard; D. Scherman; V. Ouspenski

doi:10.1117/12.2004066

18 March 2013 Control of the point defects in oxide materials to enhance functionalities in imaging

B. Viana, Th. Maldiney, S. Blahuta, A. Béssière, D. Gourier, C. Richard, D. Scherman, V. Ouspenski

Proceedings Volume 8626, Oxide-based Materials and Devices IV; 86260R (2013) https://doi.org/10.1117/12.2004066
Event: SPIE OPTO, 2013, San Francisco, California, United States

Abstract

Last generation medical imaging equipments require materials which possess outstanding performances. For scintillators in the high energy imaging field (PET), crystals with high light yields allow a decrease of the irradiation dose received by the patients during medical application and a more accurate diagnostic. Thermally stimulated luminescence (TSL) data provides the depth of hole or electron traps which can limit the efficiency and increase the kinetic. If these traps are due to lanthanide ions, the level schemes can predict the depth values. Thanks to comparison between TSL glow curves and energy diagrams, the traps inside oxide-based-hosts can be identified. Two examples are proposed here, first, the scintillation in the Ce:LYSO crystals which can be improved by thermal annealing and where divalent cations are used for charge compensation and traps removal and second, optical imaging using a new approach where persistent luminescent nanoparticles are used for in-vivo imaging. In both cases, traps depth should be carefully controlled.

Citation Download Citation

B. Viana, Th. Maldiney, S. Blahuta, A. Béssière, D. Gourier, C. Richard, D. Scherman, and V. Ouspenski "Control of the point defects in oxide materials to enhance functionalities in imaging", Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260R (18 March 2013); https://doi.org/10.1117/12.2004066

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