Contactless optical measurements of plant dimensional parameters

Steven van den Berg; Job van der Laken; Hedde Van Hoorn; Naomi van der Kolk

doi:10.1117/12.3000344

13 March 2024 Contactless optical measurements of plant dimensional parameters

Steven van den Berg, Job van der Laken, Hedde Van Hoorn, Naomi van der Kolk

Proceedings Volume PC12879, Photonic Technologies in Plant and Agricultural Science; PC1287905 (2024) https://doi.org/10.1117/12.3000344
Event: SPIE LASE, 2024, San Francisco, California, United States

Abstract

We present optical methods for contactless measurement of two plant parameters that are relevant for e.g. tomato growth: ‘head thickness’ (the thickness of the stem about 30 cm below the top), and leaf area index (LAI, the leaf area per unit ground area). For LAI a 3D camera is exploited. First results show that leaf area can be determined with an uncertainty <8% under laboratory conditions with would be sufficiently accurate. For head thickness an optical caliper based on a laser and a line array has been developed, showing an uncertainty well below the required 0.1 mm.

Conference Presentation

Citation Download Citation

Steven van den Berg, Job van der Laken, Hedde Van Hoorn, and Naomi van der Kolk "Contactless optical measurements of plant dimensional parameters", Proc. SPIE PC12879, Photonic Technologies in Plant and Agricultural Science, PC1287905 (13 March 2024); https://doi.org/10.1117/12.3000344

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