Dr. Andreas Menzel
at Paul Scherrer Institut
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 9 September 2019 Paper
Klaus Wakonig, Ana Diaz, Sabina Chiriotti, Anna Bergamaschi, Anne Bonnin, Marco Stampanoni, Andreas Menzel
Proceedings Volume 11112, 111120I (2019) https://doi.org/10.1117/12.2528905
KEYWORDS: X-rays, Objectives, X-ray imaging, Sensors, Microscopes, Zone plates, Image resolution, Image quality, Hard x-rays, Phase contrast, Alignment procedures, Quantitative analysis, Detector development

Proceedings Article | 18 September 2015 Paper
Manuel Guizar-Sicairos, Mirko Holler, Ana Diaz, Julio da Silva, Esther Tsai, Oliver Bunk, Carlos Martinez-Perez, Philip Donoghue, Charles Wellman, Andreas Menzel
Proceedings Volume 9592, 95920A (2015) https://doi.org/10.1117/12.2188313
KEYWORDS: X-rays, Light sources, Reconstruction algorithms, Tomography, Algorithm development, X-ray microscopy, Coherence imaging, X-ray imaging, X-ray characterization, Refractive index

Proceedings Article | 3 November 2011 Paper
Proceedings Volume 8011, 80118F (2011) https://doi.org/10.1117/12.903688
KEYWORDS: X-rays, Coherence imaging, X-ray imaging, Tomography, X-ray microscopy, X-ray diffraction, Algorithm development, Absorption, Image quality, X-ray computed tomography

Proceedings Article | 28 September 2011 Paper
Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Sergey Gorelick, Vitaliy Guzenko, Petri Karvinen, Cameron Kewish, Elina Färm, Mikko Ritala, Alexandre Mantion, Oliver Bunk, Andreas Menzel, Christian David
Proceedings Volume 8139, 81390E (2011) https://doi.org/10.1117/12.893235
KEYWORDS: X-rays, Coherence imaging, Iridium, X-ray optics, Electron beam lithography, Zone plates, X-ray diffraction, Reconstruction algorithms, Hard x-rays, Spatial resolution

Proceedings Article | 22 May 2009 Paper
A. Menzel, M. Dierolf, C. Kewish, P. Thibault, K. Jefimovs, C. David, M. Bech, T. Jensen, R. Feidenhans'l, A.-M. Heegaard, R. Hansen, T. Berthing, K. Martinez, J. Als-Nielsen, S. Kapishnikov, L. Leiserowitz, F. Pfeiffer, O. Bunk
Proceedings Volume 7378, 73780O (2009) https://doi.org/10.1117/12.821823
KEYWORDS: X-ray microscopy, X-rays, Microscopy, Scattering, X-ray imaging, Light scattering, Coherence imaging, Sensors, Optics manufacturing, Phase contrast

Showing 5 of 8 publications
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