Dr. Arnold W. Yanof
Project Manager at Freescale Semiconductor Inc
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 7 June 2004 Paper
Arnold Yanof, Karen Jachimowicz
Proceedings Volume 5301, (2004) https://doi.org/10.1117/12.525756
KEYWORDS: Sensors, Contrast transfer function, Visualization, Spatial frequencies, CMOS sensors, Visibility, Contrast sensitivity, Modulation, Manufacturing, Eye

Proceedings Article | 18 August 2000 Paper
Proceedings Volume 4181, (2000) https://doi.org/10.1117/12.395750
KEYWORDS: Lithography, Standards development, Scanning electron microscopy, Electron microscopes

Proceedings Article | 2 June 2000 Paper
Arnold Yanof, Vincent Plachecki, Frank Fischer, Marcelo Cusacovich, Chris Nelson, Mark Merrill
Proceedings Volume 3998, (2000) https://doi.org/10.1117/12.386520
KEYWORDS: Semiconducting wafers, Inspection, Signal processing, Particles, Defect detection, Lithography, Optical inspection, Optical lithography, Visualization, Interference (communication)

Proceedings Article | 2 June 2000 Paper
Proceedings Volume 3998, (2000) https://doi.org/10.1117/12.386524
KEYWORDS: Semiconducting wafers, Scanning electron microscopy, Metrology, Atomic force microscopy, Wafer testing, Contamination, Manufacturing, Critical dimension metrology, Lithography, Standards development

Proceedings Article | 14 June 1999 Paper
Arnold Yanof, A. Daou, James Annand, M. Pantel, Cliff Drowley, John Helbert, Carlos Ygartua, Clive Hayzelden
Proceedings Volume 3677, (1999) https://doi.org/10.1117/12.350821
KEYWORDS: Transmittance, Absorbance, Semiconducting wafers, Optical filters, Metrology, Glasses, Silicon, Oscillators, Calibration, Metals

Showing 5 of 10 publications
Proceedings Volume Editor (2)

Conference Committee Involvement (2)
Electron-Beam, X-Ray, and Ion-Beam Technology: Submicrometer Lithographies VIII
27 February 1989 | San Jose, CA, United States
Electron-Beam, X-Ray, and Ion Beam Technology: Submicrometer Lithographies VII
31 January 1988 | Newport Beach, CA, United States
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