Dr. Ashesh Parikh Profile

Dr. Ashesh Parikh

Entrepreneur

SPIE Involvement:

Author

Area of Expertise:

Analytics , Leadership , Insights , Data Science , Off-shore Team Management , Image Segmentation

Ashesh Parikh is an entrepreneur and an expert in providing insights and understanding of your structured or unstructured data to derive conclusions from it. He provides expertise to transform your data into BI to make strategic business decisions from it. He is an experienced R&D engineer, innovator, data architect, entrepreneur and data science consultant. Passionate in helping business understand their needs and delivering to their expectations.

Working on open source tools/database to discover patterns and finding mathematical relationships between them. Focus on computational techniques (regression, clustering/classification, neural networks, support vector machines, and many more).

Sector expertise in Healthcare & Medical Imaging, Utilities, Oil and Gas, Semiconductor, Manufacturing. Dr Parikh brings 20 yrs of experience in Computational Lithography to integrate design and manufacturing both at Hewlett Packard and Texas Instruments. He has been awarded/filed over 10 Patents and published over 10 peer-reviewed papers. He holds an M.S. in Chemical Engineering from Tufts University and Ph.D. in Materials Science from Georgia Institute of Technology.

Proceedings Article | 17 March 2015 Paper

PACS on mobile devices

Ashesh Parikh, Nihal Mehta

Proceedings Volume 9418, 94180F (2015) https://doi.org/10.1117/12.2081557

KEYWORDS: Picture Archiving and Communication System, Medical imaging, Mobile devices, Image processing, Edge detection, Standards development, Reconstruction algorithms, Internet, Tumors, Detection and tracking algorithms

Read Abstract +

Proceedings Article | 17 March 2015 Paper

PACS: next generation

Ashesh Parikh, Nihal Mehta

Proceedings Volume 9418, 94180G (2015) https://doi.org/10.1117/12.2081987

KEYWORDS: Picture Archiving and Communication System, Clouds, Databases, Medical imaging, Medicine, Standards development, Internet, Edge detection, Surgery, Local area networks

Read Abstract +

Proceedings Article | 17 March 2015 Paper

Web-based PACS and EHR system

Ashesh Parikh, Nihal Mehta

Proceedings Volume 9418, 94180A (2015) https://doi.org/10.1117/12.2081975

KEYWORDS: Picture Archiving and Communication System, Clouds, Medical imaging, Medicine, Tumors, Positron emission tomography, Telecommunications, Databases, Breast, Magnetic resonance imaging

Read Abstract +

Proceedings Article | 15 March 2012 Paper

Simultaneous calibration of acid diffusion and developer loading parameters for computational lithography

Ashesh Parikh

Proceedings Volume 8325, 83250L (2012) https://doi.org/10.1117/12.916200

KEYWORDS: Diffusion, Data modeling, SRAF, Computational lithography, Calibration, Analog electronics, Modulation, Lithography, Etching, Photoresist processing

Read Abstract +

Proceedings Article | 20 April 2011 Paper

Fast and accurate calibration for OPC process-window model using inverse weight algorithm

Ashesh Parikh

Proceedings Volume 7971, 79710P (2011) https://doi.org/10.1117/12.877489

KEYWORDS: Calibration, Data modeling, Optical proximity correction, Lithography, Process modeling, Critical dimension metrology, Computational lithography, Scanning electron microscopy, Photoresist processing, Metrology

Read Abstract +

Proceedings Article | 4 April 2011 Paper

Extending analog design scaling to sub-wavelength lithography: co-optimization of RET and photomasks

Ashesh Parikh, Siew Dorris, Tom Smelko, Walter Walbrick, Pushpa Mahalingam, John Arch, Kent Green, Vishal Garg, Peter Buck, Craig West

Proceedings Volume 7974, 79740N (2011) https://doi.org/10.1117/12.877487

KEYWORDS: Photomasks, Reticles, Deep ultraviolet, Analog electronics, Silicon, Optical proximity correction, Critical dimension metrology, Lithography, Resolution enhancement technologies, CMOS technology

Read Abstract +

Proceedings Article | 16 July 2002 Paper

Quantification of OPC performance of 150-nm gates using top-down CD-SEM

Ashesh Parikh, Haiqing Zhou, Chih-Yu Wang, Craig MacNaughton

Proceedings Volume 4689, (2002) https://doi.org/10.1117/12.473489

KEYWORDS: Optical proximity correction, Semiconducting wafers, Critical dimension metrology, Scanning electron microscopy, Image processing, Line edge roughness, Data modeling, Image analysis, Shape analysis, Silicon

Read Abstract +

Proceedings Article | 27 June 1996 Paper

MBE flexible manufacturing for HgCdTe focal plane arrays

J. Benson, John Dinan, James Waterman, Christopher Summers, Rudolph Benz, Brent Wagner, S. Pearson, Ashesh Parikh, John Jensen, Owen Wu, Rajesh Rajavel, G. Kamath, Karl Harris, Steven Jost, Jose Arias, Lester Kozlowski, Majid Zandian, Jagmohan Bajaj, Kadri Vural, Roger DeWames, Charles Cockrum, G. Venzor, Scott Johnson, H.-D. Shih, M. Bevan, J. Dodge, Art Simmons

Proceedings Volume 2744, (1996) https://doi.org/10.1117/12.243457

KEYWORDS: Staring arrays, Manufacturing, Liquid phase epitaxy, Mercury cadmium telluride, Semiconducting wafers, Sensors, Detector arrays, Heterojunctions, Infrared radiation, Detector development

Read Abstract +

Proceedings Article | 1 September 1995 Paper

Optical and electrical properties of iodine-doped HgCdTe alloys and superlattices grown by metalorganic molecular beam epitaxy

Christopher Summers, Ashesh Parikh, Tuyen Tran, Jens Tomm, P. Schafer, Nancy Giles, S. Pearson, Rudolph Benz, Brent Wagner, Robert Bicknell-Tassius

Proceedings Volume 2554, (1995) https://doi.org/10.1117/12.218202

KEYWORDS: Mercury cadmium telluride, Doping, Iodine, Superlattices, Cadmium, Excitons, Stereolithography, Electrons, Optical properties, Luminescence

Read Abstract +

Showing 5 of 9 publications

Keywords/Phrases

Search In:

Publication Years