Dr. Babarada N. Florin
at Univ Politehnica din Bucuresti
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 March 2004 Paper
Proceedings Volume 5275, (2004) https://doi.org/10.1117/12.522950
KEYWORDS: Resistance, Transistors, Scattering, Molybdenum, Distortion, Doping, Field effect transistors, Analog electronics, Electrons, Surface roughness

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